Fig. 5From: Examination of metal mobilization from a gunshot by scanning acoustic microscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy, and inductively coupled plasma optical emission spectroscopy: a case reportJEOL JIB-4601 focused ion beam scanning electron microscope multi-beam platform coupled with Oxford X-MaxN energy-dispersive X-ray spectroscopy system. GIS gas injection system, SE secondary electronBack to article page